Nano/micro-beam deflections: Investigation of subjected forces and applications
Micro- and Nano beam MEMS devices possess a broad range of applications owing to their capability to produce precise mechanical motion and sensing capabilities at a small scale. In the field of biomedicine, these devices have been employed in applications such as tissue engineering, lab-on-a-chip sy...
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Format: | Article |
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Elsevier
2023-12-01
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Series: | Physics Open |
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Online Access: | http://www.sciencedirect.com/science/article/pii/S266603262300056X |
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author | Nikta Shamsmohammadi Hamid Samadi Mohammad Rahimzadeh Zohreh Asadi Davood Domiri Ganji |
author_facet | Nikta Shamsmohammadi Hamid Samadi Mohammad Rahimzadeh Zohreh Asadi Davood Domiri Ganji |
author_sort | Nikta Shamsmohammadi |
collection | DOAJ |
description | Micro- and Nano beam MEMS devices possess a broad range of applications owing to their capability to produce precise mechanical motion and sensing capabilities at a small scale. In the field of biomedicine, these devices have been employed in applications such as tissue engineering, lab-on-a-chip systems, and implantable devices. Medical devices, particularly those involved in drug delivery, are significantly impacted by the forces applied to them. Therefore, it is imperative to carefully evaluate the effects of axial force and optimize the device's design to ensure that it can endure the forces it will encounter during operation. Despite being relatively weak, the van der Waals force warrants careful consideration when working at the micro- and nanoscales. In this research, the nonlinear equation obtained by the Galerkin method for a doubly clamped nano/micro-beam under the effect of Van der Waals (vdW) force was solved. The Homotopy Perturbation Method (HPM) and the Akbari Ganji Method (AGM) are introduced to investigate the nonlinear problem in this paper analytically. To validate and investigate the accuracy of the AG and HP methods, the obtained results were compared to the Runge-Kutta approach. The obtained results for all data sets showed the high accuracy of the AG and HP methods. Also, this paper investigated the effect of axial force N on beam type N/MEMS deflection. The axial force N effect in both tensional (N > 0) and compressive (N < 0) modes has been investigated. Due to the obtained results, increasing the axial force compressively increases the deflection of the beam. However, this trend is reversed for the tensional axial force. |
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format | Article |
id | doaj.art-8e344057df174920bd7364019967fb6e |
institution | Directory Open Access Journal |
issn | 2666-0326 |
language | English |
last_indexed | 2024-03-09T01:26:31Z |
publishDate | 2023-12-01 |
publisher | Elsevier |
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series | Physics Open |
spelling | doaj.art-8e344057df174920bd7364019967fb6e2023-12-10T06:17:40ZengElsevierPhysics Open2666-03262023-12-0117100191Nano/micro-beam deflections: Investigation of subjected forces and applicationsNikta Shamsmohammadi0Hamid Samadi1Mohammad Rahimzadeh2Zohreh Asadi3Davood Domiri Ganji4Department of Electrical Engineering, Shahrood University of Technology, Shahrood, IranDepartment of Mechanical Engineering, Babol Noshirvani University of Technology, Babol, IranDepartment of Mechanical Engineering, Faculty of Engineering, Golestan University, Gorgan, IranDepartment of Mechanical Engineering, Babol Noshirvani University of Technology, Babol, IranDepartment of Mechanical Engineering, Babol Noshirvani University of Technology, Babol, Iran; Corresponding author.Micro- and Nano beam MEMS devices possess a broad range of applications owing to their capability to produce precise mechanical motion and sensing capabilities at a small scale. In the field of biomedicine, these devices have been employed in applications such as tissue engineering, lab-on-a-chip systems, and implantable devices. Medical devices, particularly those involved in drug delivery, are significantly impacted by the forces applied to them. Therefore, it is imperative to carefully evaluate the effects of axial force and optimize the device's design to ensure that it can endure the forces it will encounter during operation. Despite being relatively weak, the van der Waals force warrants careful consideration when working at the micro- and nanoscales. In this research, the nonlinear equation obtained by the Galerkin method for a doubly clamped nano/micro-beam under the effect of Van der Waals (vdW) force was solved. The Homotopy Perturbation Method (HPM) and the Akbari Ganji Method (AGM) are introduced to investigate the nonlinear problem in this paper analytically. To validate and investigate the accuracy of the AG and HP methods, the obtained results were compared to the Runge-Kutta approach. The obtained results for all data sets showed the high accuracy of the AG and HP methods. Also, this paper investigated the effect of axial force N on beam type N/MEMS deflection. The axial force N effect in both tensional (N > 0) and compressive (N < 0) modes has been investigated. Due to the obtained results, increasing the axial force compressively increases the deflection of the beam. However, this trend is reversed for the tensional axial force.http://www.sciencedirect.com/science/article/pii/S266603262300056XDouble clamped beamMEMSAGMHPMMicrobeam |
spellingShingle | Nikta Shamsmohammadi Hamid Samadi Mohammad Rahimzadeh Zohreh Asadi Davood Domiri Ganji Nano/micro-beam deflections: Investigation of subjected forces and applications Physics Open Double clamped beam MEMS AGM HPM Microbeam |
title | Nano/micro-beam deflections: Investigation of subjected forces and applications |
title_full | Nano/micro-beam deflections: Investigation of subjected forces and applications |
title_fullStr | Nano/micro-beam deflections: Investigation of subjected forces and applications |
title_full_unstemmed | Nano/micro-beam deflections: Investigation of subjected forces and applications |
title_short | Nano/micro-beam deflections: Investigation of subjected forces and applications |
title_sort | nano micro beam deflections investigation of subjected forces and applications |
topic | Double clamped beam MEMS AGM HPM Microbeam |
url | http://www.sciencedirect.com/science/article/pii/S266603262300056X |
work_keys_str_mv | AT niktashamsmohammadi nanomicrobeamdeflectionsinvestigationofsubjectedforcesandapplications AT hamidsamadi nanomicrobeamdeflectionsinvestigationofsubjectedforcesandapplications AT mohammadrahimzadeh nanomicrobeamdeflectionsinvestigationofsubjectedforcesandapplications AT zohrehasadi nanomicrobeamdeflectionsinvestigationofsubjectedforcesandapplications AT davooddomiriganji nanomicrobeamdeflectionsinvestigationofsubjectedforcesandapplications |