To suppress thermomigration of Cu–Sn intermetallic compounds in flip-chip solder joints

We report here an approach to inhibit Cu–Sn intermetallic compounds (IMCs) in flip chip solder joints under thermal-gradient annealing. We reflowed two types of solders joints, Cu/SnAg/Cu and Cu/SnAg/Ni, in an oven (isothermal) and on a hot plate (with thermal-gradient) at 260 °C. During the isother...

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Bibliographic Details
Main Authors: Yan-Rong Huang, Dinh-Phuc Tran, Po-Ning Hsu, Shih-Chi Yang, A.M. Gusak, K.N. Tu, Chih Chen
Format: Article
Language:English
Published: Elsevier 2023-05-01
Series:Journal of Materials Research and Technology
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2238785423010530