Relating X-band SAR Backscattering to Leaf Area Index of Rice in Different Phenological Phases

Relating X-band SAR Backscattering to Leaf Area Index of Rice in Different Phenological Phases

The objective of this study is to provide complete information on the dynamic relationship between X-band (3.11 cm) backscattering intensity (σ°) and rice crop’s leaf area index (LAI) at all growth phases. Though the relationship between X-band σ° and LA...

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Bibliographic Details
Main Authors: Sonia Asilo, Andrew Nelson, Kees de Bie, Andrew Skidmore, Alice Laborte, Aileen Maunahan, Eduardo Jimmy P. Quilang
Format: Article
Language:English
Published: MDPI AG 2019-06-01
Series:Remote Sensing
Subjects:
X-band
SAR
LAI
backscattering intensity
rice
Online Access:https://www.mdpi.com/2072-4292/11/12/1462

Internet

https://www.mdpi.com/2072-4292/11/12/1462

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