Defect Detection for Wear Debris Based on Few-Shot Contrastive Learning

In industrial defect detection tasks, the low probability of occurrence of severe industrial defects under normal production conditions has brought a great challenge for data-driven deep learning models that have just a few samples. Contrastive learning based on a sample pair makes it possible to ob...

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Bibliographic Details
Main Authors: Hang Li, Li Li, Hongbing Wang
Format: Article
Language:English
Published: MDPI AG 2022-11-01
Series:Applied Sciences
Subjects:
Online Access:https://www.mdpi.com/2076-3417/12/23/11893