Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions

Background and Blended Spectral Line Reduction in Precision Spectroscopy of EUV and X-ray Transitions in Highly Charged Ions

Extreme ultraviolet spectra of Na-like and Mg-like Os and Ir were recorded at the National Institute of Standards and Technology using a grazing incidence spectrometer. We report a method in EBIT spectral analysis that reduces signals from contaminant lines of known or unknown origin. We utilize sim...

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Bibliographic Details
Main Authors: Adam Hosier, Dipti, Yang Yang, Paul Szypryt, Grant P. Mondeel, Aung Naing, Joseph N. Tan, Roshani Silwal, Galen O’Neil, Alain Lapierre, Steven A. Blundell, John D. Gillaspy, Gerald Gwinner, Antonio C. C. Villari, Yuri Ralchenko, Endre Takacs
Format: Article
Language:English
Published: MDPI AG 2023-03-01
Series:Atoms
Subjects:
spectroscopy
highly-charged ions
EBIT
line blend
Online Access:https://www.mdpi.com/2218-2004/11/3/48

Internet

https://www.mdpi.com/2218-2004/11/3/48

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