Near-crack-tip measurements within an Arlequin modeling for the numerical evaluation of far-field quantities of interest

Bibliographic Details
Main Authors:	Humbert L., Puel G., Jamond O., Ben Dhia H.
Format:	Article
Language:	English
Published:	EDP Sciences 2010-06-01
Series:	EPJ Web of Conferences
Online Access:	http://dx.doi.org/10.1051/epjconf/20100642014

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