Mechanical breakdown of bent silicon nanowires imaged by coherent x-ray diffraction
We have developed a method of coherent x-ray diffractive imaging to surmount its inability to image the structure of strongly strained crystals. We used calculated models from finite–element analysis to guide an iterative algorithm to fit experimental data from a series of increasingly bent wires cu...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2013-01-01
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| Series: | New Journal of Physics |
| Online Access: | https://doi.org/10.1088/1367-2630/15/12/123007 |