Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance

Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance

We applied photoreflectance (PR) spectroscopy for contactless determination of the electric field strength at buried interfaces in metal–insulator–semiconductor (MIS) structures. The PR is an all-optical version of an electromodulated reflectance spectroscopy. The tradeoff of this adoption is that t...

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Bibliographic Details
Main Authors: Eiichi Kobayashi, Koya Satta, Ryoga Inoue, Ken Suzuki, Takayuki Makino
Format: Article
Language:English
Published: MDPI AG 2021-03-01
Series:Solids
Subjects:
optical properties
interface science
instrumentation
Online Access:https://www.mdpi.com/2673-6497/2/2/8

Internet

https://www.mdpi.com/2673-6497/2/2/8

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