Contactless Determination of Electric Field in Metal–Insulator–Semiconductor Interfaces by Using Constant DC-Reflectivity Photoreflectance
We applied photoreflectance (PR) spectroscopy for contactless determination of the electric field strength at buried interfaces in metal–insulator–semiconductor (MIS) structures. The PR is an all-optical version of an electromodulated reflectance spectroscopy. The tradeoff of this adoption is that t...
Main Authors: | Eiichi Kobayashi, Koya Satta, Ryoga Inoue, Ken Suzuki, Takayuki Makino |
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Format: | Article |
Language: | English |
Published: |
MDPI AG
2021-03-01
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Series: | Solids |
Subjects: | |
Online Access: | https://www.mdpi.com/2673-6497/2/2/8 |
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