Practical Experiments to Evaluate Quality Metrics of MRAM-Based Physical Unclonable Functions
Process variations in the manufacturing of digital circuits can be leveraged to design Physical Unclonable Functions (PUFs) that are extensively employed in hardware-based security. Different PUFs based on Magnetic Random-Access-Memory (MRAM) devices have been studied and proposed in the literature....
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IEEE
2020-01-01
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| Series: | IEEE Access |
| Subjects: | |
| Online Access: | https://ieeexplore.ieee.org/document/9200460/ |