Lateral resolution enhanced interference microscopy using virtual annular apertures

Lateral resolution enhanced interference microscopy using virtual annular apertures

The lateral resolution in microscopic imaging generally depends on both, the wavelength of light and the numerical aperture of the microscope objective lens. To quantify the lateral resolution Ernst Abbe considered an optical grating illuminated by plane waves. In contrast, the Rayleigh criterion ho...

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Bibliographic Details
Main Authors: Peter Lehmann, Lucie Hüser, Andre Stelter, Thomas Kusserow
Format: Article
Language:English
Published: IOP Publishing 2023-01-01
Series:JPhys Photonics
Subjects:
interference microscopy
coherence scanning interferometry
three-dimensional transfer function
lateral resolution
Fourier optics
Kirchhoff approximation
Online Access:https://doi.org/10.1088/2515-7647/acb249

Internet

https://doi.org/10.1088/2515-7647/acb249

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