Effect of Thermal Cyclic Loading on Stress-Strain Response and Fatigue Life of 3D Chip Stacking Structure

Abstract The thermo-mechanical reliability of IMCs (Ni3Sn4, Cu3Sn, Cu6Sn5) solder joints and Sn-3.9Ag-0.6Cu solder joints was investigated systematically in 3D chip stacking structure subjected to an accelerated thermal cyclic loading based on finite element simulation and Taguchi method. Effects of...

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Bibliographic Details
Main Authors: Liang Zhang, Weimin Long, Sujuan Zhong
Format: Article
Language:English
Published: SpringerOpen 2021-11-01
Series:Chinese Journal of Mechanical Engineering
Subjects:
Online Access:https://doi.org/10.1186/s10033-021-00640-w