Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

Spatially Resolved High Voltage Kelvin Probe Force Microscopy: A Novel Avenue for Examining Electrical Phenomena at Nanoscale

Abstract Kelvin probe force microscopy (KPFM) is a well‐established scanning probe technique, used to measure surface potential accurately; it has found extensive use in the study of a range of materials phenomena. In its conventional form, KPFM frustratingly precludes imaging samples or scenarios w...

Full description

Bibliographic Details
Main Authors: Conor J. McCluskey, Niyorjyoti Sharma, Jesi R. Maguire, Serene Pauly, Andrew Rogers, TJ Lindsay, Kristina M. Holsgrove, Brian J. Rodriguez, Navneet Soin, John Marty Gregg, Raymond G. P. McQuaid, Amit Kumar
Format: Article
Language:English
Published: Wiley-VCH 2024-07-01
Series:Advanced Physics Research
Subjects:
ferroelectrics
high‐voltage KPFM
potential mapping
pyroelectrics
triboelectric
Online Access:https://doi.org/10.1002/apxr.202400011

Internet

https://doi.org/10.1002/apxr.202400011

Similar Items