Mask or Enhance: Data Curation Aiding the Discovery of Piezoresponse Force Microscopy Contributors
Abstract Piezoresponse force microscopy (PFM) is routinely used to probe the nanoscale electromechanical response of ferroelectric and piezoelectric materials. However, many challenges remain in the interpretation of the recovered signal. Specifically, many non‐ferroelectric contributions affect the...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Wiley-VCH
2023-06-01
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| Series: | Advanced Physics Research |
| Subjects: | |
| Online Access: | https://doi.org/10.1002/apxr.202200090 |