Mask or Enhance: Data Curation Aiding the Discovery of Piezoresponse Force Microscopy Contributors

Mask or Enhance: Data Curation Aiding the Discovery of Piezoresponse Force Microscopy Contributors

Abstract Piezoresponse force microscopy (PFM) is routinely used to probe the nanoscale electromechanical response of ferroelectric and piezoelectric materials. However, many challenges remain in the interpretation of the recovered signal. Specifically, many non‐ferroelectric contributions affect the...

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Bibliographic Details
Main Authors: Gardy Kevin Ligonde, Kerisha N. Williams, Iaroslav Gaponenko, Nazanin Bassiri‐Gharb
Format: Article
Language:English
Published: Wiley-VCH 2023-06-01
Series:Advanced Physics Research
Subjects:
clustering
data curation
dimensional stacking
ferroelectricity
piezoresponse force microscopy
Online Access:https://doi.org/10.1002/apxr.202200090

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