Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review

Imaging with a Commercial Electron Backscatter Diffraction (EBSD) Camera in a Scanning Electron Microscope: A Review

Scanning electron microscopy is widespread in field of material science and research, especially because of its high surface sensitivity due to the increased interactions of electrons with the target material’s atoms compared to X-ray-oriented methods. Among the available techniques in sca...

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Bibliographic Details
Main Authors: Nicolas Brodusch, Hendrix Demers, Raynald Gauvin
Format: Article
Language:English
Published: MDPI AG 2018-07-01
Series:Journal of Imaging
Subjects:
dark-field (DF)
electron channeling contrast imaging (ECCI)
electron channeling pattern (ECP)
electron backscatter diffraction (EBSD)
deformation
scanning electron microscope (SEM)
transmission kikuchi diffraction (TKD
t-EFSD
t-EBSD)
Online Access:http://www.mdpi.com/2313-433X/4/7/88

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http://www.mdpi.com/2313-433X/4/7/88

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