Overview of Key Techniques for In Situ Tests of Electromagnetic Radiation Emission Characteristics

With the growing number of electronic devices loaded and increasing influence from electromagnetic interference, large-scale systems or platforms are confronted with increasingly severe electromagnetic compatibility challenges. Due to the vast size of these systems and the multitude of electronic de...

ver descrição completa

Detalhes bibliográficos
Principais autores: Zhonghao Lu, Yan Chen, Yunxiao Xue
Formato: Artigo
Idioma:English
Publicado em: MDPI AG 2024-11-01
coleção:Sensors
Assuntos:
Acesso em linha:https://www.mdpi.com/1424-8220/24/23/7515