Atomic positions and displacements in piezoelectric materials Ca3TaGa3Si2O14 and Ca3TaGa1.5Al1.5Si2O14 investigated by Ta-Lα X-ray fluorescence holography

Atomic positions and displacements in piezoelectric materials Ca3TaGa3Si2O14 and Ca3TaGa1.5Al1.5Si2O14 investigated by Ta-Lα X-ray fluorescence holography

The atomic positions and displacements of atoms around the Ta atom in piezoelectric materials Ca3TaGa3Si2O7 (CTGS) and Ca3TaGa1.5Al1.5Si2O7 (CTGAS) were investigated at 100 K by Ta-Lα X-ray fluorescence holography (XFH). The experimental atomic images were compared with the simulated ones using the...

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Bibliographic Details
Main Authors: Mamoru Kitaura, Artoni Kevin R. Ang, Yuta Yamamoto, Naohisa Happo, Koji Kimura, Kouichi Hayashi, Shinta Watanabe, Yuui Yokota, Yuji Ohashi, Kei Kamada, Akira Yoshikawa, Hisanori Yamane, Akimasa Ohnishi
Format: Article
Language:English
Published: Frontiers Media S.A. 2022-09-01
Series:Frontiers in Materials
Subjects:
piezoelectric materials
langasite structure
X-ray fluorescence holography
X-ray diffractometry
positional shift
Online Access:https://www.frontiersin.org/articles/10.3389/fmats.2022.977371/full

Internet

https://www.frontiersin.org/articles/10.3389/fmats.2022.977371/full

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