A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips

A Toolchain to Quantify Burn-In Stress Effectiveness on Large Automotive System-on-Chips

Complexity and performance of Automotive System-on-Chips have exponentially grown in the last decade, also according to technology advancements. Unfortunately, this trend directly and profoundly impacts modern Electronic Design Automation tools, which must handle very large amounts of logic gates. T...

Full description

Bibliographic Details
Main Authors: Francesco Angione, Davide Appello, Paolo Bernardi, Andrea Calabrese, Stefano Quer, Matteo Sonza Reorda, Vincenzo Tancorre, Roberto Ugioli
Format: Article
Language:English
Published: IEEE 2023-01-01
Series:IEEE Access
Subjects:
Automotive SoCs burn-in
simulation analysis
parallel applications
density aware metrics
toggle activity
stress-test evaluation
Online Access:https://ieeexplore.ieee.org/document/10254201/

Internet

https://ieeexplore.ieee.org/document/10254201/

Similar Items