A New Instrument Monitoring Method Based on Few-Shot Learning
As an important part of the industrialization process, fully automated instrument monitoring and identification are experiencing an increasingly wide range of applications in industrial production, autonomous driving, and medical experimentation. However, digital instruments usually have multi-digit...
| Main Authors: | , , , , , |
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| Format: | Article |
| Language: | English |
| Published: |
MDPI AG
2023-04-01
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| Series: | Applied Sciences |
| Subjects: | |
| Online Access: | https://www.mdpi.com/2076-3417/13/8/5185 |