Modelling of changes in the resistivity of semi-insulating materials
Electrical properties of semiconductor materials depend on their defect structure. Point defects, impurities or admixture contained in a semiconductor material, strongly affect its properties and determine the performance parameters of devices made on its basis. The results of the currently used met...
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| Format: | Article |
| Language: | English |
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Polish Academy of Sciences
2021-09-01
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| Series: | Metrology and Measurement Systems |
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| Online Access: | https://journals.pan.pl/Content/120625/art12_i.pdf |