A neural network for phenotyping Fusarium‐damaged kernels (FDKs) in wheat and its impact on genomic selection accuracy

Abstract Fusarium head blight (FHB) remains one of the most destructive diseases in wheat. Primarily caused by the mycotoxigenic fungi Fusarium graminearum, FHB results in both widespread yield loss and deoxynivalenol (DON) contamination of wheat grain. Phenotyping for Fusarium‐damaged kernels (FDKs...

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Bibliographic Details
Main Authors: Junzhe Wu, Arlyn Ackerman, Rupesh Gaire, Girish Chowdhary, Jessica Rutkoski
Format: Article
Language:English
Published: Wiley 2023-12-01
Series:Plant Phenome Journal
Online Access:https://doi.org/10.1002/ppj2.20065