The Diagnosis of Shunt Defects in CIGS Modules Using Lock-In Thermography: An Empirical Comparative Study

Shunt defects are often detected in solar panels intended for photovoltaic applications. However, existing nondestructive detection technologies have certain inherent drawbacks depending on the application scenario. In this context, this paper reports a comprehensive empirical investigation into loc...

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Bibliographic Details
Main Authors: Seung Hoon Lee, Hae-Seok Lee, Donghwan Kim, Yoonmook Kang
Format: Article
Language:English
Published: MDPI AG 2023-10-01
Series:Energies
Subjects:
Online Access:https://www.mdpi.com/1996-1073/16/21/7226