Rapid Identification of Material Defects Based on Pulsed Multifrequency Eddy Current Testing and the k-Nearest Neighbor Method

Rapid Identification of Material Defects Based on Pulsed Multifrequency Eddy Current Testing and the k-Nearest Neighbor Method

The article discusses the utilization of Pulsed Multifrequency Excitation and Spectrogram Eddy Current Testing (PMFES-ECT) in conjunction with the supervised learning method for the purpose of estimating defect parameters in conductive materials. To obtain estimates for these parameters, a three-dim...

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Bibliographic Details
Main Authors: Jacek M. Grochowalski, Tomasz Chady
Format: Article
Language:English
Published: MDPI AG 2023-10-01
Series:Materials
Subjects:
multifrequency excitation and spectrogram eddy current testing
nondestructive testing
k-Nearest Neighbors (k-NN) algorithm
eddy currents
finite element analysis
numerical simulations
Online Access:https://www.mdpi.com/1996-1944/16/20/6650

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https://www.mdpi.com/1996-1944/16/20/6650

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