X-Ray Polarimetry as a Tool to Constrain Orbital Parameters in X-Ray Binaries

X-Ray Polarimetry as a Tool to Constrain Orbital Parameters in X-Ray Binaries

X-ray binary systems consist of a companion star and a compact object in close orbit. Thanks to their copious X-ray emission, these objects have been studied in detail using X-ray spectroscopy and timing. The inclination of these systems is a major uncertainty in the determination of the mass of the...

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Bibliographic Details
Main Authors: John Rankin, Vadim Kravtsov, Fabio Muleri, Juri Poutanen, Frédéric Marin, Fiamma Capitanio, Giorgio Matt, Enrico Costa, Alessandro Di Marco, Sergio Fabiani, Fabio La Monaca, Lorenzo Marra, Paolo Soffitta
Format: Article
Language:English
Published: IOP Publishing 2024-01-01
Series:The Astrophysical Journal
Subjects:
Polarimetry
X-ray binary stars
Low-mass x-ray binary stars
High mass x-ray binary stars
Binary stars
Orbit determination
Online Access:https://doi.org/10.3847/1538-4357/ad1991

Internet

https://doi.org/10.3847/1538-4357/ad1991

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