Constellation loss: Improving the efficiency of deep metric learning loss functions for the optimal embedding of histopathological images
Background: Deep learning diagnostic algorithms are proving comparable results with human experts in a wide variety of tasks, and they still require a huge amount of well-annotated data for training, which is often non affordable. Metric learning techniques have allowed a reduction in the required a...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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Elsevier
2020-01-01
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| Series: | Journal of Pathology Informatics |
| Subjects: | |
| Online Access: | http://www.jpathinformatics.org/article.asp?issn=2153-3539;year=2020;volume=11;issue=1;spage=38;epage=38;aulast=Medela |