Distress related to psychotic experiences: Enhancing the world health organization composite international diagnostic interview psychosis screen

Distress related to psychotic experiences: Enhancing the world health organization composite international diagnostic interview psychosis screen

Abstract Background The abbreviated version of the World Health Organization (WHO) Composite International Diagnostic Interview (CIDI) psychosis screen tends to yield high prevalence in online samples. Psychotic Experiences (PE) may not necessarily indicate current or imminent psychopathology; howev...

Full description

Bibliographic Details
Main Authors: Hans Oh, Nicole R. Karcher, Nirit Soffer‐Dudek, Ai Koyanagi, Megan Besecker, Jordan E. DeVylder
Format: Article
Language:English
Published: Wiley 2024-03-01
Series:International Journal of Methods in Psychiatric Research
Subjects:
CIDI
distress
psychosis
psychotic experiences
WHO
Online Access:https://doi.org/10.1002/mpr.1977

Internet

https://doi.org/10.1002/mpr.1977

Similar Items