Single-Event Transient Study of 28 nm UTBB-FDSOI Technology Using Pulsed Laser Mapping

Single-Event Transient Study of 28 nm UTBB-FDSOI Technology Using Pulsed Laser Mapping

Single-event transient (SET)-induced soft errors are becoming a more significant threat to the reliability of electronic systems in space, especially for advanced technologies. The SET pulse width, which is vulnerable to SET propagation, is a critical parameter for developing SET mitigation techniqu...

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Bibliographic Details
Main Authors: Rui Chen, Li Chen, Sai Li, Rui Liu, Xuantian Li, Shuting Shi, Cheng Gu, Jianwei Han
Format: Article
Language:English
Published: MDPI AG 2023-03-01
Series:Electronics
Subjects:
single-event transient
SET
28 nm UTBB FDSOI
pulse broadening
pulse laser
SET mapping
Online Access:https://www.mdpi.com/2079-9292/12/5/1214

Internet

https://www.mdpi.com/2079-9292/12/5/1214

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