Local dose distribution and changing resist cross-sectional shapes in electron beam lithography

In order to apply resist patterns fabricated by electron beam lithography to nanoimprint molds, it is necessary to consider not only line widths and hole diameters observed two-dimensionally from the exposure top surface, but also three-dimensionally including resist cross-sectional shapes. In this...

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Bibliographic Details
Main Authors: Tatsuki SUGIHARA, Arata KANEKO
Format: Article
Language:Japanese
Published: The Japan Society of Mechanical Engineers 2024-01-01
Series:Nihon Kikai Gakkai ronbunshu
Subjects:
Online Access:https://www.jstage.jst.go.jp/article/transjsme/90/930/90_23-00232/_pdf/-char/en