Surface characterization of Al thin film dependent on the substrate using fractal geometry
In this paper, Al films were deposited on glass and steel substrates by using thermal evaporation technique. X-ray diffraction (XRD) analysis was used for structural characterization of Al thin films. It was found that the growth process mechanism of Al film on two substrates was different. The diff...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
Semnan University
2023-12-01
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| Series: | Progress in Physics of Applied Materials |
| Subjects: | |
| Online Access: | https://ppam.semnan.ac.ir/article_8344_c68d3eaf2511e6b38cc07499b825bae1.pdf |