On Neural Networks Based Electrothermal Modeling of GaN Devices

This paper presents an efficient artificial neural network (ANN) electrothermal modeling approach applied to GaN devices. The proposed method is based on decomposing the device nonlinearity into intrinsic trapping-induced and thermal-induced nonlinearities that can be simulated by low-order ANN mode...

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Main Author: Anwar Jarndal
Format: Article
Language:English
Published: IEEE 2019-01-01
Series:IEEE Access
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8760248/
_version_ 1828964393773170688
author Anwar Jarndal
author_facet Anwar Jarndal
author_sort Anwar Jarndal
collection DOAJ
description This paper presents an efficient artificial neural network (ANN) electrothermal modeling approach applied to GaN devices. The proposed method is based on decomposing the device nonlinearity into intrinsic trapping-induced and thermal-induced nonlinearities that can be simulated by low-order ANN models. The ANN models are then interconnected in the physics-relevant equivalent circuit to accurately simulate the transistor. Genetic algorithm (GA)-based training procedure has been implemented to find optimal values for the weights of the ANN models. The modeling approach is used to develop a large-signal model for a 1-mm gate-width GaN high-electron mobility transistor (HMET). The model has been implemented in the advanced design system (ADS) and it has been validated by pulsed and continues small- and large-signal measurements. The model simulations showed a very good agreement with the measurements and verify the validity of the developed technique for dynamic electrothermal modeling of active devices.
first_indexed 2024-12-14T10:48:56Z
format Article
id doaj.art-97046841b21845928eeec681baa2a175
institution Directory Open Access Journal
issn 2169-3536
language English
last_indexed 2024-12-14T10:48:56Z
publishDate 2019-01-01
publisher IEEE
record_format Article
series IEEE Access
spelling doaj.art-97046841b21845928eeec681baa2a1752022-12-21T23:05:19ZengIEEEIEEE Access2169-35362019-01-017942059421410.1109/ACCESS.2019.29283928760248On Neural Networks Based Electrothermal Modeling of GaN DevicesAnwar Jarndal0https://orcid.org/0000-0002-1873-2088Electrical and Computer Engineering Department, University of Sharjah, Sharjah, United Arab EmiratesThis paper presents an efficient artificial neural network (ANN) electrothermal modeling approach applied to GaN devices. The proposed method is based on decomposing the device nonlinearity into intrinsic trapping-induced and thermal-induced nonlinearities that can be simulated by low-order ANN models. The ANN models are then interconnected in the physics-relevant equivalent circuit to accurately simulate the transistor. Genetic algorithm (GA)-based training procedure has been implemented to find optimal values for the weights of the ANN models. The modeling approach is used to develop a large-signal model for a 1-mm gate-width GaN high-electron mobility transistor (HMET). The model has been implemented in the advanced design system (ADS) and it has been validated by pulsed and continues small- and large-signal measurements. The model simulations showed a very good agreement with the measurements and verify the validity of the developed technique for dynamic electrothermal modeling of active devices.https://ieeexplore.ieee.org/document/8760248/GaN HEMTelectrothermal modelingneural networksgenetic algorithm optimization
spellingShingle Anwar Jarndal
On Neural Networks Based Electrothermal Modeling of GaN Devices
IEEE Access
GaN HEMT
electrothermal modeling
neural networks
genetic algorithm optimization
title On Neural Networks Based Electrothermal Modeling of GaN Devices
title_full On Neural Networks Based Electrothermal Modeling of GaN Devices
title_fullStr On Neural Networks Based Electrothermal Modeling of GaN Devices
title_full_unstemmed On Neural Networks Based Electrothermal Modeling of GaN Devices
title_short On Neural Networks Based Electrothermal Modeling of GaN Devices
title_sort on neural networks based electrothermal modeling of gan devices
topic GaN HEMT
electrothermal modeling
neural networks
genetic algorithm optimization
url https://ieeexplore.ieee.org/document/8760248/
work_keys_str_mv AT anwarjarndal onneuralnetworksbasedelectrothermalmodelingofgandevices