Determination of the reflectivity of crystals by ptychography
The x-ray reflectivity of crystals is an important measure for their quality. Its knowledge is of interest for the development of materials as well as for the design of x-ray optical instruments, while the determination of the reflectivity curve is not trivial. This article presents an approach to r...
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| Format: | Article |
| Language: | English |
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AIP Publishing LLC
2022-12-01
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| Series: | AIP Advances |
| Online Access: | http://dx.doi.org/10.1063/5.0102867 |