Application of bias correction methods to improve U3Si2 sample preparation for quantitative analysis by WDXRF
The determination of silicon (Si), total uranium (U) and impurities in uranium-silicide (U3Si2) samples by wavelength dispersion X-ray fluorescence technique (WDXRF) has been already validated and is currently implemented at IPEN’s X-Ray Fluorescence Laboratory (IPEN-CNEN/SP) in São Paulo, Brazil. S...
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| Format: | Article |
| Language: | English |
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Brazilian Radiation Protection Society (Sociedade Brasileira de Proteção Radiológica, SBPR)
2019-02-01
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| Series: | Brazilian Journal of Radiation Sciences |
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| Online Access: | https://bjrs.org.br/revista/index.php/REVISTA/article/view/582 |