Reliability assessment of high-power GaN-HEMT devices with different buffers under influence of gate bias and high-temperature tests
This study compares Vth-instability in D-mode MIS-HEMT devices between two epitaxial layers, AlN/AlGaN/GaN superlattice-W1, and three-step graded AlGaN-W2. Experimental results demonstrate that W1 exhibits ∼13% less Vth-instability compared to W2, with distinct degradation regions at specific voltag...
| Main Authors: | , , , |
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| Format: | Article |
| Language: | English |
| Published: |
IOP Publishing
2024-01-01
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| Series: | Applied Physics Express |
| Subjects: | |
| Online Access: | https://doi.org/10.35848/1882-0786/ad56f8 |