Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements

Double-edge scan wavefront metrology and its application in crystal diffraction wavefront measurements

Achieving diffraction-limited performance in fourth-generation synchrotron radiation sources demands monochromator crystals that can preserve the wavefront across an unprecedented extensive range. There is an urgent need for techniques of absolute crystal diffraction wavefront measurement. At the Be...

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Bibliographic Details
Main Authors: Fang Liu, Ming Li, Qianshun Diao, Zhe Li, Zhibang Shen, Fan Li, Zhen Hong, Hongkai Lian, Shuaipeng Yue, Qingyan Hou, Changrui Zhang, Dongni Zhang, Congcong Li, Fugui Yang, Junliang Yang
Format: Article
Language:English
Published: International Union of Crystallography 2024-09-01
Series:Journal of Synchrotron Radiation
Subjects:
wavefront metrology
crystal diffraction
double-edge
diffraction-limited
wavefront error
Online Access:https://journals.iucr.org/paper?S1600577524006222

Internet

https://journals.iucr.org/paper?S1600577524006222

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