EBIC studies of minority electron diffusion length in undoped p-type gallium oxide

EBIC studies of minority electron diffusion length in undoped p-type gallium oxide

Minority carrier diffusion length in undoped p-type gallium oxide was measured at various temperatures as a function of electron beam charge injection by electron beam-induced current technique in situ using a scanning electron microscope. The results demonstrate that charge injection into p-type β-...

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Bibliographic Details
Main Authors: Leonid Chernyak, Seth Lovo, Jian-Sian Li, Chao-Ching Chiang, Fan Ren, Stephen J. Pearton, Corinne Sartel, Zeyu Chi, Yves Dumont, Ekaterine Chikoidze, Alfons Schulte, Arie Ruzin, Ulyana Shimanovich
Format: Article
Language:English
Published: AIP Publishing LLC 2024-11-01
Series:AIP Advances
Online Access:http://dx.doi.org/10.1063/5.0238027

Internet

http://dx.doi.org/10.1063/5.0238027

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