Dual Material Pile Gate Approach for Low Leakage Finfet

FinFET (Fin Field-Effect Transistor) technology has recently seen a major increase in adoption for use in integrated circuits because of its high immunity to short channel effects and its further ability to scale down. Previously, a major research contribution was made to reduce the leakage curr...

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Bibliographic Details
Main Authors: Sanjay S. Chopade, Dinesh V. Padole
Format: Article
Language:English
Published: Universitas Indonesia 2017-01-01
Series:International Journal of Technology
Subjects:
Online Access:http://ijtech.eng.ui.ac.id/article/view/236