Error Analysis for Repeatability Enhancement of a Dual-Rotation Mueller Matrix Ellipsometer

Since the Mueller matrix ellipsometer has been used as a highly accurate tool for thin film measurement, the error analysis and repeatability enhancement of such a tool are of great importance. The existence of the Poisson–Gaussian mixed noise and the random bias of the trigger signal in the optical...

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Bibliographic Details
Main Authors: Zhou Jiang, Song Zhang, Jiaming Liu, Qi Li, Hao Jiang, Shiyuan Liu
Format: Article
Language:English
Published: Frontiers Media S.A. 2022-01-01
Series:Frontiers in Physics
Subjects:
Online Access:https://www.frontiersin.org/articles/10.3389/fphy.2021.820552/full