SCAN-TO-BIM METHODOLOGY ADAPTED FOR DIFFERENT APPLICATION

In this paper we proposed a methodology that describes the major steps of a scan-to-BIM process. The methodology includes six steps: (1) classification of considered elements, (2) definition of required level of detail (GI), (3) scan data acquisition, (4) point cloud registration and segmentation, (...

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Bibliographic Details
Main Authors: V. Badenko, A. Fedotov, D. Zotov, S. Lytkin, D. Volgin, R. D. Garg, M. Liu
Format: Article
Language:English
Published: Copernicus Publications 2019-09-01
Series:The International Archives of the Photogrammetry, Remote Sensing and Spatial Information Sciences
Online Access:https://www.int-arch-photogramm-remote-sens-spatial-inf-sci.net/XLII-5-W2/1/2019/isprs-archives-XLII-5-W2-1-2019.pdf