In-Situ Contact Surface Characterization in a MEMS Ohmic Switch under Low Current Switching
To develop robust microelectromechanical systems (MEMS) switching technology for low voltage direct current (DC) applications (1–12 V) there is a requirement for the investigation of wear caused by hot switching (contact operated while carrying a current load). Previous investigation of co...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
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MDPI AG
2018-05-01
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| Series: | Technologies |
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| Online Access: | http://www.mdpi.com/2227-7080/6/2/47 |