In-Situ Contact Surface Characterization in a MEMS Ohmic Switch under Low Current Switching

In-Situ Contact Surface Characterization in a MEMS Ohmic Switch under Low Current Switching

To develop robust microelectromechanical systems (MEMS) switching technology for low voltage direct current (DC) applications (1–12 V) there is a requirement for the investigation of wear caused by hot switching (contact operated while carrying a current load). Previous investigation of co...

Full description

Bibliographic Details
Main Authors: Thomas G. Bull, John W. McBride
Format: Article
Language:English
Published: MDPI AG 2018-05-01
Series:Technologies
Subjects:
microelectromechanical systems (MEMS) switching
contact wear
surface wear
direct current (DC) switching
hot switching
low current switching
Online Access:http://www.mdpi.com/2227-7080/6/2/47

Similar Items

Similar Items