Frequency Noise Characterization of a 25-GHz Diode-Pumped Mode-Locked Laser With Indirect Carrier-Envelope Offset Noise Assessment

We present a detailed frequency noise characterization of an ultrafast diode-pumped solid-state laser operating at 25-GHz repetition rate. The laser is based on the gain material Er:Yb:glass and operates at a wavelength of 1.55 μm. Using a beating measurement with an ultralow-noise contin...

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Bibliographic Details
Main Authors: Pierre Brochard, Valentin Johannes Wittwer, Slawomir Bilicki, Bojan Resan, Kurt John Weingarten, Stephane Schilt, Thomas Sudmeyer
Format: Article
Language:English
Published: IEEE 2018-01-01
Series:IEEE Photonics Journal
Subjects:
Online Access:https://ieeexplore.ieee.org/document/8240971/