A shape-based inter-layer contours correspondence method for ICT-based reverse engineering.

The correspondence of a stack of planar contours in ICT (industrial computed tomography)-based reverse engineering, a key step in surface reconstruction, is difficult when the contours or topology of the object are complex. Given the regularity of industrial parts and similarity of the inter-layer c...

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Bibliographic Details
Main Authors: Liming Duan, Shangpeng Yang, Gui Zhang, Fei Feng, Minghui Gu
Format: Article
Language:English
Published: Public Library of Science (PLoS) 2017-01-01
Series:PLoS ONE
Online Access:http://europepmc.org/articles/PMC5425182?pdf=render