Genetic dissection of tetraploid cotton resistant to Verticillium wilt using interspecific chromosome segment introgression lines

Genetic dissection of tetraploid cotton resistant to Verticillium wilt using interspecific chromosome segment introgression lines

Verticillium wilt (caused by the pathogen Verticillium dahliae) is of high concern for cotton producers and consumers. The major strategy for controlling this disease is the development of resistant cotton (Gossypium spp.) cultivars. We used interspecific chromosome segment introgression lines (CSIL...

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Bibliographic Details
Main Authors: Peng Wang, Zhiyuan Ning, Ling Lin, Hong Chen, Hongxian Mei, Jun Zhao, Bingliang Liu, Xin Zhang, Wangzhen Guo, Tianzhen Zhang
Format: Article
Language:English
Published: KeAi Communications Co., Ltd. 2014-10-01
Series:Crop Journal
Subjects:
Resistance; QTL
Chromosome
Pyramiding
Gossypium hirsutum
Gossypium barbadense
Online Access:http://www.sciencedirect.com/science/article/pii/S2214514114000592

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http://www.sciencedirect.com/science/article/pii/S2214514114000592

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