Single event burnout failures caused in silicon carbide power devices by alpha particles emitted from radionuclides
Single event burnouts (SEB) threaten the safe operation of high voltage SiC power devices in a wide range of applications. The triggering of this failure mechanism has been widely documented for the case of heavy ions and neutron interactions. In this study, it is demonstrated experimentally that de...
| Main Authors: | , |
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| Format: | Article |
| Language: | English |
| Published: |
Elsevier
2023-09-01
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| Series: | e-Prime: Advances in Electrical Engineering, Electronics and Energy |
| Subjects: | |
| Online Access: | http://www.sciencedirect.com/science/article/pii/S2772671123000980 |