Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration

We investigated the screw hole position of a board level reliability (BLR) test board to improve the fatigue reliability of solder joints under thermal cycling and random vibration. We developed a finite element model of a BLR test board and derived the plastic strain energy density and 1-sigma stre...

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Main Authors: Jisup Lee, Hyunsik Jeong, Gunhee Jang
Format: Article
Language:English
Published: MDPI AG 2024-02-01
Series:Materials
Subjects:
Online Access:https://www.mdpi.com/1996-1944/17/3/755
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author Jisup Lee
Hyunsik Jeong
Gunhee Jang
author_facet Jisup Lee
Hyunsik Jeong
Gunhee Jang
author_sort Jisup Lee
collection DOAJ
description We investigated the screw hole position of a board level reliability (BLR) test board to improve the fatigue reliability of solder joints under thermal cycling and random vibration. We developed a finite element model of a BLR test board and derived the plastic strain energy density and 1-sigma stress, which are the main parameters influencing the fatigue life of solder joints under thermal cycling and random vibration, respectively. We analyzed the correlation between the screw hole position and the main parameters of the fatigue life through sensitivity analysis. By performing multi-objective optimization, we determined the screw hole position that maximizes the fatigue life of solder joints under thermal cycling and random vibration. With the optimal screw hole position, the fatigue life significantly increased under thermal cycling and random vibration compared to the BLR test board with the initial screw hole position.
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spelling doaj.art-9d704db765c54efa866455a3d09e3e6c2024-02-09T15:18:00ZengMDPI AGMaterials1996-19442024-02-0117375510.3390/ma17030755Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random VibrationJisup Lee0Hyunsik Jeong1Gunhee Jang2Department of Mechanical Convergence Engineering, Hanyang University, Seoul 04763, Republic of KoreaDepartment of Mechanical Convergence Engineering, Hanyang University, Seoul 04763, Republic of KoreaDepartment of Mechanical Convergence Engineering, Hanyang University, Seoul 04763, Republic of KoreaWe investigated the screw hole position of a board level reliability (BLR) test board to improve the fatigue reliability of solder joints under thermal cycling and random vibration. We developed a finite element model of a BLR test board and derived the plastic strain energy density and 1-sigma stress, which are the main parameters influencing the fatigue life of solder joints under thermal cycling and random vibration, respectively. We analyzed the correlation between the screw hole position and the main parameters of the fatigue life through sensitivity analysis. By performing multi-objective optimization, we determined the screw hole position that maximizes the fatigue life of solder joints under thermal cycling and random vibration. With the optimal screw hole position, the fatigue life significantly increased under thermal cycling and random vibration compared to the BLR test board with the initial screw hole position.https://www.mdpi.com/1996-1944/17/3/755boundary conditionfatigue lifemulti-objective optimizationsolder joint
spellingShingle Jisup Lee
Hyunsik Jeong
Gunhee Jang
Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration
Materials
boundary condition
fatigue life
multi-objective optimization
solder joint
title Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration
title_full Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration
title_fullStr Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration
title_full_unstemmed Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration
title_short Optimization of the Boundary Conditions of a Board Level Reliability Test Board to Maximize the Fatigue Life of Ball Grid Array Solder Joints under Thermal Cycling and Random Vibration
title_sort optimization of the boundary conditions of a board level reliability test board to maximize the fatigue life of ball grid array solder joints under thermal cycling and random vibration
topic boundary condition
fatigue life
multi-objective optimization
solder joint
url https://www.mdpi.com/1996-1944/17/3/755
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AT hyunsikjeong optimizationoftheboundaryconditionsofaboardlevelreliabilitytestboardtomaximizethefatiguelifeofballgridarraysolderjointsunderthermalcyclingandrandomvibration
AT gunheejang optimizationoftheboundaryconditionsofaboardlevelreliabilitytestboardtomaximizethefatiguelifeofballgridarraysolderjointsunderthermalcyclingandrandomvibration