Lightwave-driven electron emission for polarity-sensitive terahertz beam profiling
The full exploitation of advanced light sources in the terahertz (THz) frequency range requires versatile experimental tools to fully characterize the spatial, temporal, and spectral shapes of the THz electric field. Several techniques for passive THz beam profiling exist that offer information abou...
| Main Authors: | , , |
|---|---|
| Format: | Article |
| Language: | English |
| Published: |
AIP Publishing LLC
2023-01-01
|
| Series: | APL Photonics |
| Online Access: | http://dx.doi.org/10.1063/5.0125947 |