Characterization of Dislocation Rearrangement in FCC Metals during Work Hardening Using X-ray Diffraction Line-Profile Analysis

Characterization of Dislocation Rearrangement in FCC Metals during Work Hardening Using X-ray Diffraction Line-Profile Analysis

Multiplication and rearrangement of dislocations in face-centered cubic (FCC) metals during tensile deformation are affected by grain size, stacking fault energy (SFE), and solute elements. X-ray diffraction (XRD) line-profile analysis can evaluate the dislocation density (<inline-formula><...

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Bibliographic Details
Main Authors: Koutarou Nakagawa, Momoki Hayashi, Kozue Takano-Satoh, Hirotaka Matsunaga, Hiroyuki Mori, Kazunari Maki, Yusuke Onuki, Shigeru Suzuki, Shigeo Sato
Format: Article
Language:English
Published: MDPI AG 2020-10-01
Series:Quantum Beam Science
Subjects:
stacking fault energy
solute element
transmission electron microscopy
X-ray diffraction
dislocation
line-profile analysis
Online Access:https://www.mdpi.com/2412-382X/4/4/36

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https://www.mdpi.com/2412-382X/4/4/36

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