High Al-content AlGaN channel high electron mobility transistors on silicon substrate

The rapidly increasing power demand, downsizing of power electronics and material specific limitation of silicon has led to development of AlGaN/GaN heterostructures. Commercial GaN power devices are best available for radio frequency (RF) and high voltage switching applications. Emerging AlxGa1-xN...

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Main Authors: J. Mehta, I. Abid, J. Bassaler, J. Pernot, P. Ferrandis, M. Nemoz, Y. Cordier, S. Rennesson, S. Tamariz, F. Semond, F. Medjdoub
Format: Article
Language:English
Published: Elsevier 2023-03-01
Series:e-Prime: Advances in Electrical Engineering, Electronics and Energy
Subjects:
Online Access:http://www.sciencedirect.com/science/article/pii/S2772671123000098
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author J. Mehta
I. Abid
J. Bassaler
J. Pernot
P. Ferrandis
M. Nemoz
Y. Cordier
S. Rennesson
S. Tamariz
F. Semond
F. Medjdoub
author_facet J. Mehta
I. Abid
J. Bassaler
J. Pernot
P. Ferrandis
M. Nemoz
Y. Cordier
S. Rennesson
S. Tamariz
F. Semond
F. Medjdoub
author_sort J. Mehta
collection DOAJ
description The rapidly increasing power demand, downsizing of power electronics and material specific limitation of silicon has led to development of AlGaN/GaN heterostructures. Commercial GaN power devices are best available for radio frequency (RF) and high voltage switching applications. Emerging AlxGa1-xN channel based heterostructures are promising to enhance the limits of next generation high voltage GaN power switching devices. In this work, we report on the study of electrical performance of AlGaN channel HEMTs-on-Silicon using various Al content. The fabricated devices exhibited outstanding buffer breakdown electric field above 2.5 MV/cm considering the submicron thin heterostructures grown on silicon substrate. Furthermore, we also experimentally demonstrate high temperature operation of fabricated AlGaN channel HEMTs.
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spelling doaj.art-9e24a36c7da24acd820dbbc7ad439ee92023-03-14T04:09:21ZengElseviere-Prime: Advances in Electrical Engineering, Electronics and Energy2772-67112023-03-013100114High Al-content AlGaN channel high electron mobility transistors on silicon substrateJ. Mehta0I. Abid1J. Bassaler2J. Pernot3P. Ferrandis4M. Nemoz5Y. Cordier6S. Rennesson7S. Tamariz8F. Semond9F. Medjdoub10IEMN, CNRS, Université de Lille, 59650 Villeneuve d'Ascq, France; Corresponding author.IEMN, CNRS, Université de Lille, 59650 Villeneuve d'Ascq, FranceCNRS, Grenoble INP, Institut Néel, Université Grenoble Alpes, 38000 Grenoble, FranceCNRS, Grenoble INP, Institut Néel, Université Grenoble Alpes, 38000 Grenoble, FranceCNRS, Institut Néel, Université de Toulon, Université Grenoble Alpes, 38000 Grenoble, FranceCNRS, CRHEA, Université Côte d'Azur, rue Bernard Grégory, 06560 Valbonne, FranceCNRS, CRHEA, Université Côte d'Azur, rue Bernard Grégory, 06560 Valbonne, FranceEasyGAN SAS, Rue Bernard Grégory, 06905 Sophia Antipolis Cedex, FranceCNRS, CRHEA, Université Côte d'Azur, rue Bernard Grégory, 06560 Valbonne, FranceCNRS, CRHEA, Université Côte d'Azur, rue Bernard Grégory, 06560 Valbonne, FranceIEMN, CNRS, Université de Lille, 59650 Villeneuve d'Ascq, FranceThe rapidly increasing power demand, downsizing of power electronics and material specific limitation of silicon has led to development of AlGaN/GaN heterostructures. Commercial GaN power devices are best available for radio frequency (RF) and high voltage switching applications. Emerging AlxGa1-xN channel based heterostructures are promising to enhance the limits of next generation high voltage GaN power switching devices. In this work, we report on the study of electrical performance of AlGaN channel HEMTs-on-Silicon using various Al content. The fabricated devices exhibited outstanding buffer breakdown electric field above 2.5 MV/cm considering the submicron thin heterostructures grown on silicon substrate. Furthermore, we also experimentally demonstrate high temperature operation of fabricated AlGaN channel HEMTs.http://www.sciencedirect.com/science/article/pii/S2772671123000098AlGaN-on-SiAlGaN channelUWBGHEMT
spellingShingle J. Mehta
I. Abid
J. Bassaler
J. Pernot
P. Ferrandis
M. Nemoz
Y. Cordier
S. Rennesson
S. Tamariz
F. Semond
F. Medjdoub
High Al-content AlGaN channel high electron mobility transistors on silicon substrate
e-Prime: Advances in Electrical Engineering, Electronics and Energy
AlGaN-on-Si
AlGaN channel
UWBG
HEMT
title High Al-content AlGaN channel high electron mobility transistors on silicon substrate
title_full High Al-content AlGaN channel high electron mobility transistors on silicon substrate
title_fullStr High Al-content AlGaN channel high electron mobility transistors on silicon substrate
title_full_unstemmed High Al-content AlGaN channel high electron mobility transistors on silicon substrate
title_short High Al-content AlGaN channel high electron mobility transistors on silicon substrate
title_sort high al content algan channel high electron mobility transistors on silicon substrate
topic AlGaN-on-Si
AlGaN channel
UWBG
HEMT
url http://www.sciencedirect.com/science/article/pii/S2772671123000098
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