Physical Insights into THz Rectification in Metal–Oxide–Semiconductor Transistors
Metal–oxide–semiconductor field-effect transistors (MOSFETs) have proven to be effective devices for rectifying electromagnetic radiation at extremely high frequencies, approximately 1 THz. This paper presents a new interpretation of the THz rectification process in the structure of an MOS transisto...
Main Author: | Fabrizio Palma |
---|---|
Format: | Article |
Language: | English |
Published: |
MDPI AG
2024-03-01
|
Series: | Electronics |
Subjects: | |
Online Access: | https://www.mdpi.com/2079-9292/13/7/1192 |
Similar Items
-
New Insight on Terahertz Rectification in a Metal–Oxide–Semiconductor Field-Effect Transistor Structure
by: Fabrizio Palma
Published: (2020-07-01) -
Theoretical Analysis of the Time Transient of the THz Self-Mixing Rectification Voltage in a Semiconductor Barrier
by: Fabrizio Palma
Published: (2023-03-01) -
Improving the accuracy of tumor surgery by THz imaging and making the results of pathological anatomy faster by THz spectroscopy
by: Siham Tarabichi, et al.
Published: (2022-02-01) -
Intense sub-terahertz radiation from wide-bandgap semiconductor based large-aperture photoconductive antennas pumped by UV lasers
by: X Ropagnol, et al.
Published: (2019-01-01) -
Homodyne Spectroscopy with Broadband Terahertz Power Detector Based on 90-nm Silicon CMOS Transistor
by: Kęstutis Ikamas, et al.
Published: (2021-01-01)